6TAENG201-1E
TOTAL ACCESS 3000/3010
ENG-201
Page 31 of 32
Total Access
®
3000/3010 System Manual
© 2002, ADTRAN, Inc.
1.8
Test Access 3000/3010 Support
Total Access 3000/3010 supports a comprehensive array of test capabilities, including
metallic loop test access and digital test access. Both of these capabilities are fully
supported by the system. Use of them, however, requires access modules and
multiplexers with built-in support for these test capabilities.
1.8.1
Metallic Loop Test Access
Metallic loop test access is provided through six wire-wrap pins (labeled Loop Test
Access and located at P13/P23) on the backplane. See
Figure 15
. Metallic loop test
access is available in any access module installed in the system that supports metallic
loop test access.
For testing four-wire and two-wire local loop services, these wire-wrap pins must be
wired to an external test head. For testing two-wire local loop services, only two wire-
wrap pins (T and R) need be wired.
For a circuit to provide metallic loop testing, the access module servicing that circuit
must incorporate metallic loop test capabilities. Not all access modules will
incorporate this feature. Cards without this feature may be mixed in the same system
with those that do support this feature. Configuring a circuit for metallic loop test
mode is performed through commands issued through the SCU.
P13
LOOP
TEST
ACCESS
T
R
S
T1
R1
S
Figure 15. Wire-wrap Pins for Metallic Test Access
