10
Select Exit to exit the Board Verification. In the Analy PV menu, select Acquisition
IC Verification. In the Acquisition IC Verification menu, select All Tests.
When the tests finish, the status for each test shows PASSED or FAILED, and the status for
the All Tests changes from UNTESTED to TESTED.
11
Record the results of the tests on the performance test record at the end of this
chapter.
12
If you have an oscilloscope, go to step 14. If you have a pattern generator, go to step
17. Otherwise, go to step 18.
13
If you do not have an Agilent 1670G-series logic analyzer with the oscilloscope
option or pattern generator option, exit the tests by pressing the System key. Select
the field to the right of the Sys PV field. Select the Exit Test System.
14
If you have the oscilloscope, Select Analy PV, then select Scope PV in the pop-up
menu. In the Scope PV menu, select Functional Tests then select ALL Tests.
You can run all tests at one time, except for the Data Input Inspection, by running All Tests.
To see more details about each test when troubleshooting failures, you can run each test
individually.
15
Record the results of the tests on the performance test record at the end of this
chapter.
16
To exit the test system, press the System key, then press the Select key. Select Exit
Test, then select Exit Test System.
17
If you have the pattern generator option, Select Analy PV, then select PattGen in the
pop-up menu. In the PattGen menu select All Tests.
You can run all tests at one time (except the Output Patterns routine) by selecting All Tests.
To see more details about each test, you can run each test individually. This example shows
how to run all tests at once.
When the tests finish, the status for each test shows Passed or Failed.
18
Exit the test system.
a.
Select Analy PV, Scope PV, or PattGen depending on what was last tested.
b.
Select Sys PV.
c.
Select System Test, then select Exit Test.
d.
Select Exit Test System to reload the operating system.
Testing Performance
To perform the self-tests
3–6
Summary of Contents for 1670G Series
Page 20: ...1 12...
Page 116: ...Testing Performance Performance Test Record pattern generator 3 92...
Page 126: ...Calibrating and Adjusting To test the CAL OUTPUT ports 4 10...
Page 166: ...Exploded View of the Agilent 1670G series logic analyzer Replacing Assemblies 6 4...
Page 201: ...Theory of Operation The Oscilloscope Board 8 11...
