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Chapter 3: Testing Logic Analyzer Performance
To Test the Minimum Master to Master Clock Time and Minimum Eye Width
To Test the Minimum Master to Master Clock Time and
Minimum Eye Width
The specifications for the 16910/11A logic analyzer define a minimum master to
master clock time and a minimum data eye width at which data can be acquired.
This test verifies that the logic analyzer meets these specifications.
Eye Finder is used to adjust the sampling position on every tested channel. Eye
Finder must be used to achieve minimum data eye width performance.
First, the logic analyzer will be tested in the 250 Mb/s state mode. Then it will be
tested in the 500 Mb/s state mode.
In the 250 Mb/s state mode each pod will be tested with its respective clock.
The 500 Mb/s mode has only one clock (Clk1). All tests in the 500 Mb/s mode will
use clock Clk1.
A sample of four channels on each pod will be tested, one pod at a time, in both
250 Mb/s state mode and 500 Mb/s state mode.
The logic analyzer will be configured to acquire data on both edges of the clock,
so the test frequency is set to half of the acquisition speed.
Summary of Contents for 16900 Series
Page 3: ...3 Chapter The 16910A Logic Analyzer The 16911A Logic Analyzer...
Page 8: ...8 Contents...
Page 14: ...14 Chapter 1 General Information...
Page 18: ...18 Chapter 2 Preparing for Use...
Page 61: ...61 4 Calibrating This chapter gives you instructions for calibrating the logic analyzer...
Page 65: ...65 Chapter 5 Troubleshooting Troubleshooting Flowchart 1...
Page 66: ...66 Chapter 5 Troubleshooting Troubleshooting Flowchart 2...
Page 82: ...82 Chapter 5 Troubleshooting To test the cables 18 Return to the troubleshooting flow chart...
Page 94: ...94 Chapter 7 Replaceable Parts 16910A Exploded View Exploded view of the 16910A logic analyzer...
Page 95: ...95 Chapter 7 Replaceable Parts 16911A Exploded View Exploded view of the 16911A logic analyzer...
Page 96: ...96 Chapter 7 Replaceable Parts...
Page 102: ...102 Index...