Chapter 2 Service
Troubleshooting the Instrument
2-32
Assembly Level Service Guide
2
Tables 2-5 and 2-6 list and describe the messages that are generated by
the instrument during Self-Test or during operation to indicate that a
problem has been detected. These messages are displayed on the
instrument’s front-panel display and are also sent via the RS-232 serial
output (in many cases, the exact message text that is displayed on the
front panel is a condensed form of the message that is sent via RS-232).
Table 2-5. Front Panel Display Error Messages
Message
Description
12V FAIL
The +12 VDC output from the power supply is not within specifications.
–12V FAIL
The –12 VDC output from the power supply is not within specifications.
–5V FAIL
The –5 VDC output from the power supply is not within specifications.
ADC FAIL
Failure detected in the ADC.
PATH FAIL
Failure detected in the Channel 1 signal path.
THRS FAIL
Failure detected in the Channel 1 threshold circuit.
THRS FAIL
Failure detected in the Channel 2 RF threshold circuit.
THRS THRU
Failure detected in the Channel 2 through-path threshold circuit.
THRS HET
Failure detected in the Channel 2 heterodyne-path threshold circuit.
EEP WRT FAIL
Failure detected while writing to EEPROM.
FPANEL FAIL
The front panel or its interconnecting cable is defective or not properly connected.
FPGA FAIL
Failure detected in the FPGA (Field Programmable Gate Array).
GPIB FAIL
Failure detected in the GPIB hardware.
HET PATH FAIL
Failure detected in the heterodyne-path circuit.
IIC FAIL
An attempt to write to the LCD display failed.
INSTCFG FAIL
The instrument’s configuration data is missing or has become corrupted.
OVERTEMP
The instrument’s internal temperature is above the acceptable limit.
PWR CAL FAIL
The instrument’s power-calibration data is missing or corrupted.
PWR CKT FAIL
Failure detected in the Channel 2 power-measurement circuit.
RAM FAIL
Failure detected in RAM.
ROM FAIL
Failure detected in ROM.
SAV SET FAIL
One or more of the sets of user settings is missing or is corrupted.
SERVICE FAIL
The instrument’s service data is missing or has become corrupted.
THRU FAIL
Failure detected in the through-path circuit of Channel 2.
VCO/CNT FAIL
Failure detected in the VCO or the Count Chain.
Summary of Contents for 53147A
Page 6: ...Contents vi Assembly Level Service Guide ...
Page 13: ...1 Performance Tests Verifying Specifications ...
Page 55: ...2 Service ...
Page 88: ...Chapter 2 Service Troubleshooting the Instrument 2 34 Assembly Level Service Guide 2 ...
Page 89: ...3 Replacing Assemblies Disassembly and Reassembly ...
Page 104: ...Chapter 3 Replacing Assemblies Removing the Power Supply 3 16 Assembly Level Service Guide 3 ...
Page 105: ...4 Replaceable Parts ...
Page 116: ...Chapter 4 Replaceable Parts Parts Identification 4 12 Assembly Level Service Guide 4 ...
Page 117: ...5 Backdating ...
Page 119: ...6 Specifications ...
Page 125: ...A Rack Mounting the Instrument ...
Page 134: ...Index Index 4 Assembly Level Service Guide Index ...