Analyzing Samples
40
Agilent 5500 Series FTIR Operation Manual
In the sample loading and cleaning mode, the DialPath is rotated so
the accessory window is facing up (see Figure 10). It is in this
position that the sample mounting area can be easily accessed for
loading the sample into place and cleaning the sampling surfaces
before the next sample is analyzed.
Figure 10.
DialPath with accessory window facing up
In sample analysis mode, the DialPath is rotated such that the
accessory optical window is facing down towards the 5500 DialPath
FTIR sample mounting area. In this position, infrared (IR) energy
passes through the sample, making measurement possible. Make sure
that you rotate the DialPath arm completely around until it reaches
the detent and snaps or clicks into position. This detent keeps the
accessory stationary during sample measurement (see Figure 11).
NOTE
The background measurement should be taken at the same pathlength that the
sample will be measured at.
Bottom window (2 mm
diameter yellow surface)
Position 1 ZnSe window
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