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AFM Instrumentation from
Agilent Technologies

฀gilent Technologies offers high-precision, 
modular ฀FM solutions for research, 

 

industry, and education. Exceptional 

 

worldwide support is provided by 
experienced application scientists and 
technical service personnel. ฀gilent’s 
leading-edge R&D laboratories are 

dedicated to the timely introduction and 

optimization of innovative and easy-to-use 

AFM technologies.

www.agilent.com/find/afm

Americas

Canada  

(877) 894 4414

Latin ฀merica  

305 269 7500

United States  

(800) 829 4444

Asia Pacific

฀ustralia  

1 800 629 485

China  

800 810 0189

Hong Kong  

800 938 693

India  

1 800 112 929

Japan  

0120 (421) 345

Korea  

080 769 0800

Malaysia  

1 800 888 848

Singapore  

1 800 375 8100

Taiwan  

0800 047 866

Thailand  

1 800 226 008

Europe & Middle East

฀ustria  

43 (0) 1 360 277 1571

Belgium  

32 (0) 2 404 93 40

Denmark  

45 70 13 15 15

Finland  

358 (0) 10 855 2100

France  

0825 010 700*

 

*0.125 

/minute

 

Germany  

49 (0) 7031 464 6333

Ireland  

1890 924 204

Israel  

972-3-9288-504/544

Italy  

39 02 92 60 8484

Netherlands  

31 (0) 20 547 2111

Spain  

34 (91) 631 3300

Sweden  

0200-88 22 55

Switzerland  

0800 80 53 53

United Kingdom  

44 (0) 118 9276201

Other European Countries:
                     www.agilent.com/ind/contactus

Product specifications and descriptions in this document 
subject to change without notice.

© ฀gilent Technologies, Inc. 2013
Published in US฀, November 21, 2013
5991-3639EN

Figure 8.  Humidity-dependent anodic oxidation of a silicon surface. Side-by-side AFM 
topographic images of the resulting surface after the tip-directed oxidation under a RH of 
20% (left) and a RH of 90% (right), respectively. Scan size: 6 µm.

7500 System Specifications

  Scanner 

  Scan range 

90 µm x 90 µm

  Z range 

> 12 µm

  X/Y Positioning noise(CL) 

< 0.15nm typical

  XY Linearity 

< 0.5% 

  Z noise 

< 0.03nm

  Out of plane travel  

< 0.1% Full range

  Laser  

670nm

  System Controller

  PC  

Quad core Xeon, 8G ram, 1TB disk, Win7 x74 

     

2ea 23” FPD, 1920 x1080pix resolution

  Video Microscope

  Top down video microscope 
  Manual focus and zoom 
  2 Mpixel color USB camera 

  1.7µm resolution 

  Sample Size

  Manual X/Y stage 

~ 10mm travel

  Motorized Z stage 

~ 10mm travel

  Max sample diameter 

~ 25mm

  Max sample height 

~ 8mm

  Standard Modes

  Contact, LFM, ฀฀C, Phase, CS-฀FM, MFM, EFM, KFM, Liftmode, 

 

  F-d Spectroscopy, F-V Spectroscopy, Force Plugins, Force Modulation (FMM),  
  Q-Control, LV PFM

  Optional Modes

  M฀C, STM, PicoTREC, DLFM, Nanolithography, Electrochemistry, 

 

  Heating/Cooling, Thermal K, PicoScript

  Microscope Dimensions 

  L x W x H 

191x191x 201mm

  Weight 

7.5Kg

  Potentiostat (Option) 

  Scan rate              

0.1mV/s – 10 V/s

     Current range    

5p฀ – 100m฀

     Current sensitivity            

0.01, 0.1, 1, 100, 10,000u฀/V

     Max. sample rate            

16bit @ 25kHz

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