Test Support
Copyright © ARM Limited 2000. All rights reserved.
10-7
Table 10-1 and Table 10-2 show how the registers are used. The pause bits from the
BIST control register provide extra decode of these registers.
10.3.3
Pause modes
ARM recommends that you use the following production test sequence for the SRAM:
1.
Test each SRAM using a full test.
2.
Test the BIST hardware for each SRAM.
To allow testing of the BIST hardware, a pause mechanism enables you to halt the BIST
test. This allows you to corrupt data within the SRAM. The sequence for this is:
1.
Write the address for the location to be corrupted with an
MCR
to the relevant
BIST address register
2.
Write the corrupted data using a
MCR
to the BIST general register.
Table 10-1 Instruction BIST address and general registers
BIST register
IBIST
pause
Read
Write
IBIST address register
0
IBIST fail address
IBIST start address
IBIST address register
1
IBIST fail address
IBIST peek/poke address
IBIST general register
0
IBIST fail data
IBIST seed data
IBIST general register
1
IBIST peek data
IBIST poke data
Table 10-2 Data BIST address and general registers
BIST register
IBIST
pause
Read
Write
DBIST address register
0
DBIST fail address
DBIST start address
DBIST address register
1
DBIST fail address
DBIST peek/poke address
DBIST general register
0
DBIST fail data
DBIST seed data
DBIST general register
1
DBIST peek data
DBIST poke data
Summary of Contents for ARM946E-S
Page 1: ...ARM DDI 0155A ARM946E S Technical Reference Manual ...
Page 6: ...vi Copyright ARM Limited 2000 All rights reserved ARM DDI 0155A 04 Limited Confidential ...
Page 54: ...Programmer s Model 2 34 Copyright ARM Limited 2000 All rights reserved ARM DDI 0155A ...
Page 70: ...Caches 3 16 Copyright ARM Limited 2000 All rights reserved ARM DDI 0155A ...
Page 78: ...Protection Unit 4 8 Copyright ARM Limited 2000 All rights reserved ARM DDI 0155A ...
Page 112: ...Coprocessor Interface 7 14 Copyright ARM Limited 2000 All rights reserved ARM DDI 0155A ...