Test Support
10-2
Copyright © ARM Limited 2000. All rights reserved.
10.1 About the ARM946E-S test methodology
To achieve a high level of fault coverage, you can use scan insertion and ATPG
techniques on the ARM9E-S core and ARM946E-S control logic as part of the synthesis
flow. You can use BIST to provide high fault coverage of the compiled SRAM.
Summary of Contents for ARM946E-S
Page 1: ...ARM DDI 0155A ARM946E S Technical Reference Manual ...
Page 6: ...vi Copyright ARM Limited 2000 All rights reserved ARM DDI 0155A 04 Limited Confidential ...
Page 54: ...Programmer s Model 2 34 Copyright ARM Limited 2000 All rights reserved ARM DDI 0155A ...
Page 70: ...Caches 3 16 Copyright ARM Limited 2000 All rights reserved ARM DDI 0155A ...
Page 78: ...Protection Unit 4 8 Copyright ARM Limited 2000 All rights reserved ARM DDI 0155A ...
Page 112: ...Coprocessor Interface 7 14 Copyright ARM Limited 2000 All rights reserved ARM DDI 0155A ...