Test Support
10-2
Copyright © 2000 ARM Limited. All rights reserved.
ARM DDI 0186A
10.1
About the ARM966E-S test methodology
To achieve a high level of fault coverage, scan insertion and ATPG techniques are used
on the ARM9E-S core and ARM966E-S control logic as part of the synthesis flow.
BIST is used to provide high fault coverage of the compiled SRAM.
Summary of Contents for ARM966E-S
Page 6: ...Contents vi Copyright 2000 ARM Limited All rights reserved ARM DDI 0186A ...
Page 20: ...Introduction 1 4 Copyright 2000 ARM Limited All rights reserved ARM DDI 0186A ...
Page 48: ...Tightly coupled SRAM 4 12 Copyright 2000 ARM Limited All rights reserved ARM DDI 0186A ...
Page 80: ...Bus Interface Unit 6 20 Copyright 2000 ARM Limited All rights reserved ARM DDI 0186A ...
Page 118: ...Debug Support 8 26 Copyright 2000 ARM Limited All rights reserved ARM DDI 0186A ...
Page 130: ...Test Support 10 8 Copyright 2000 ARM Limited All rights reserved ARM DDI 0186A ...
Page 142: ...Instruction cycle timings 11 12 Copyright 2000 ARM Limited All rights reserved ARM DDI 0186A ...
Page 158: ...Signal Descriptions A 16 Copyright 2000 ARM Limited All rights reserved ARM DDI 0186A ...
Page 176: ...AC Parameters B 18 Copyright 2000 ARM Limited All rights reserved ARM DDI 0186A ...