A8.7
Error injection
To support testing of error handling software, the Cortex-A76 core can inject errors in the error detection
logic.
The following table describes all the possible types of error that the core can encounter and therefore
inject.
Table A8-3 Errors injected in the Cortex-A76 core
Error type
Description
Corrected errors
A CE is generated for a single-bit ECC error on L1 data caches and L2 caches, both on data and tag RAMs.
Deferred errors
A DE is generated for a double-bit ECC error on L1 data caches and L2 caches, but only on data RAM.
Uncorrected errors A UE is generated for a double-bit ECC error on L1 data caches and L2 caches, but only on tag RAM.
The following table describes the registers that handle error injection in the Cortex-A76 core.
Table A8-4 Error injection registers
Register name
Description
ERR0PFGFR_EL1
The ERR Pseudo Fault Generation Feature register defines which errors can be injected.
ERR0PFGCTLR_EL1 The ERR Pseudo Fault Generation Control register controls the errors that are injected.
ERR0PFGCDNR_EL1 The ERR Pseudo Fault Generation Count Down register controls the fault injection timing.
Note
This mechanism simulates the corruption of any RAM but the data is not actually corrupted.
See also:
•
B3.9 ERR0PFGFR, Error Pseudo Fault Generation Feature Register
•
B3.8 ERR0PFGCTLR, Error Pseudo Fault Generation Control Register
.
•
B3.7 ERR0PFGCDNR, Error Pseudo Fault Generation Count Down Register
A8 Reliability, Availability, and Serviceability (RAS)
A8.7 Error injection
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