A1.5
Test features
The Cortex-A76 core provides test signals that enable the use of both
Automatic Test Pattern Generation
(ATPG) and
Memory Built-In Self Test
(MBIST) to test the core logic and memory arrays.
A1 Introduction
A1.5 Test features
100798_0300_00_en
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A1-30
Non-Confidential
Summary of Contents for Cortex-A76 Core
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