1.1
JTAG signals
Most Arm-based devices are physically equipped with several pins that are dedicated to debug and test
purposes. Four of these pins make up the IEEE 1149.1 interface, also known as the JTAG interface. This
interface is often used for boundary-scan testing during the manufacture of printed circuit boards. The
interface also provides a useful way to access one or more cores and other components in a device, while
running its application software.
Test Data In (TDI)
The
TDI
signal is an input to the target device which provides a stream of serial data from the debug
unit.
The
TDI
signal must be pulled
HIGH
on the target to keep the signal inactive when no debug unit is
connected.
Test Mode Select (TMS)
The
TMS
signal is an input to the target device which controls its JTAG state-machine.
The
TMS
signal must be pulled
HIGH
on the target to keep the signal inactive when no debug unit is
connected.
Test Clock (TCK)
The
TCK
signal is an input to the target device which synchronizes its JTAG state-machine. On each
rising edge of the
TCK
signal, the target samples the
TDI
, and
TMS
signals.
Consider
TCK
as a strobe signal, rather than a clock signal, because it is typically non-continuous and
only becomes active during debug communications.
TCK
can be pulled
HIGH
on the target, however, to maintain full compatibility with other JTAG
equipment, Arm recommends you pull
TCK
LOW
.
Test Data Out (TDO)
The
TDO
signal is an output from the target device which returns a stream of serial data to the debug
unit.
TDO
can be left floating on the target, however, to maintain full compatibility with other JTAG
equipment, Arm recommends you pull
TDO
HIGH
.
Basic JTAG connection
In the simplest form (omitting pull-up and pull-down resistors), a connection between the debug unit and
the target device looks like:
Target
Device
Debug
Unit
TDI
TMS
TCK
TDO
TDI
TMS
TCK
TDO
Figure 1-1 Simple JTAG connection
Note
The naming convention of the
TDI
(Test Data In) and
TDO
(Test Data Out) signals is always with
respect to the target device.
1 Debug and trace interface
1.1 JTAG signals
101714_0100_02_en
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