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Issue 02 - 07/2001
English
59
SPECIFICATION AND WARRANTY
Wavelength range
190 -1100nm in 0.1nm data intervals
Monochromator
1200 lines/mm Aberration corrected concave
grating
Maximum scanning speed
7300 nm/minute at 2 nm intervals
Spectral bandwidth
< 1.8nm
Wavelength accuracy
± 0.7nm
Wavelength reproducibility
± 0.2nm
Light source
Tungsten halogen and deuterium lamps
Detectors
silicon photodiode
Photometric range
- 3.000 to 3.000A, -99999 to 99999 concentration
units, 0.1 to 200%T
Photometric accuracy
± 0.5% or ± 0.003A to 3.000A at 546 nm,
whichever is the larger
Photometric reproducibility
within 0.5% of absorbance value to 3.000A at
546nm
Stability
± 0.001A per hour at 340nm at 0A after warm up
(tungsten lamp)
Stray light
<0.025 %T at 220nm using NaI and <0.025 %T at
340nm using NaNO
2
Digital output
9 pin serial and Centronics parallel
Sample compartment size
210 x 140 x 80mm
Dimensions
520 x 370 x 230mm
Weight
13kg
Power requirements
90 - 265V AC ± 10%, 50/60Hz, 80VA
Safety Standard
EN61010-1
EMC emissions
EN 61326-2.3 Generic emissions
EMC immunity
EN 61000-4-6 Generic immunity part 1
Mains harmonics
EN 61000-3-2
Quality System
Designed and manufactured in accordance with
an ISO9001 approved quality system
British Design Registration
No.
2097049
Specifications are measured at a constant ambient temperature and are typical of a
production unit. As part of our policy of continuous development, we reserve the
right to alter specifications without notice.
