4. Commands
UniSite-xpi User Manual
4-93
Yield Tally
The Yield Tally command allows you to maintain programming
information on devices that have been programmed.
This information can be very useful in a manufacturing environment
where device yield statistics must be kept. Yield statistics are maintained
on the last 16 device types programmed. If you attempt a yield tally on a
17th device, UniSite-xpi drops the statistics for the oldest device.
UniSite-xpi stores the manufacturer name and its part number or
family/pinout codes as the device name in the yield tally record.
The yield data is stored on the System disk in a file called ytally.sys. If the
file does not exist, enabling the Yield Tally option creates a blank copy of
this file on the disk.
Note: You may upload the yield statistics while in CRC mode by using
command 43]. The CRC command 46] clears the yield tally statistics.
CRC commands are described in Chapter 5, “Computer Remote Control.”
Space is allocated for the Yield Tally data files on the System disk. When
the Yield Tally function is invoked without the System disk, the error
message
System disk not found. Cannot access yield data.
is displayed on the terminal or, if you are in CRC mode, error code 9A is
returned.
Yield Total
The Yield total does not include those devices with error conditions that
are not recorded in one of the four categories: illegal bit, mis-verify,
device not programmable, structured test failure. Examples of these
conditions are continuity check, electronic ID error, or overcurrent.
The Yield Tally screen provides statistics for the following categories:
•
Device Name
—Manufacturer’s name and part number,
family/pinout codes. Statistics for the last sixteen device types are
kept.
•
Total Count
—The number of individual devices of the same type
that UniSite-xpi attempted to program.
•
Good Part
—The number of devices successfully programmed.
•
Illegal Bit
—The number of devices that failed because they did not
pass non-blank test or Illegal Bit Check.
•
Verify Fail
—The number of devices that failed because they did not
verify.
•
Struct Fail
—The number of logic devices of the same type that failed
the logic structured vector test.
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Yield Tally
Yield
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Summary of Contents for UniSite-xpi
Page 2: ...981 0014 UniSite Programming System User Manual Also Covering Legacy UniSite Programmers ...
Page 72: ...2 Setup and Installation 2 42 UniSite xpi User Manual ...
Page 134: ...3 Getting Started 3 62 UniSite xpi User Manual ...
Page 238: ...5 Computer Remote Control 5 10 UniSite xpi User Manual ...
Page 296: ...6 Translation Formats 6 58 UniSite xpi User Manual ...
Page 402: ...Keep Current Subscription Service 6 Keep Current ...