Eaton Cutler-Hammer FP-5000 Instructions Manual Download

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IL17569

Page 9-4

Effective June, 2001

9.2.1 Relay Test

The FP-5000 has provisions for testing the output relays
individually or as a group. From the front panel Test menu, use the
Operate Relays and Reset Relays menu functions to energize and
de-energize the relays. The same functionality is provided via the
communication interface. When a relay is energized using the Relay
Test function, it will remain energized until it is de-energized through
the Reset menu, Test menu or Remote Reset.

9.2.2 Disarm Trip

The FP-5000 relay can be disarmed to prevent operation of the Trip
1 and Trip 2 output relays during testing. When the Disarm Control
System Configuration setting is Enabled (activated by the “Set”
pushbutton), the user can Disarm tripping using the Test menu Arm/
Disarm Trip function (activated by the “Test” pushbutton). The Relay
Healthy Alarm is de-energized when tripping is disarmed.

9.3 Programmable Logic Elements

The FP-5000 provides programmable logic for programming custom
functions. The Programmable Logic functions include 12 blocking
gates for the overcurrent protective functions, six logic gates, six
timer gates, two latches, and seven output gates. The basic logic
element for the blocking gates, logic gates, and output gates is a 4-
input logic gate that can be configured as Disabled, or as an AND,
OR, NAND, or NOR function. Each logic gate accepts up to four
inputs, which can be entered directly or negated. The following table
shows the output of each function for any combination of inputs.

Table 9.3 Logic Functions

Inputs

Outputs

IN1

IN2

IN3

IN4

AND

NOR

NAND

Figure 9-3. Programmable Logic Elements

The default settings for the input and output functions are defined in
the previous sections. The default settings for the remaining logic
functions are disabled or unused. User Defined logic may only be
entered under the Set Mode if the “Prog Logic” setting in the
System Configuration menu is changed from Default to Custom.

If a diagnostic failure is detected, the protective functions and
logic functions are disabled and the Relay Healthy Alarm relay is
de-energized. The other relays will not change state.

9.4 Trip and Alarm Blocking

The FP-5000 has blocking logic functions to block operation of the
overcurrent protective functions. A Blocking logic gate is provided
for each of the nine instantaneous overcurrent and three inverse-
time overcurrent protective functions. They are: 50X-1, 50X-2, 50X-
3, 50R-1, 50R-2, 50R-3, 50P-1, 50P-2, 50P-3, 51P, 51R, 51X. Each
logic gate can be configured as Disabled or as an AND, OR, NAND,
or NOR function. Each logic gate accepts up to four inputs, which
can be entered directly or negated.

A programmable logic gate or timer gate output may be connected
to other timer or logic gates, used to trigger waveform capture
(Logic Gate 6), or tied to an output gate to control an output relay.

Figure 9-4. Blocking Logic Gate

Each timer gate has a single input and a single output with internal
on-delay and off-delay timers. The setting range on the timers is 0
to 9999 cycles with 1-cycle resolution. The latches include a set input
and a reset input. The reset input has the highest priority. If both the
set and reset inputs are active, the latch output is inactive. A diagram
of each logic gate is shown in

Figure 9-3

Programmable Logic Elements.