Appendix A Electrical Characteristics
MC9S12XE-Family Reference Manual Rev. 1.19
Freescale Semiconductor
1205
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
Table A-2. ESD and Latch-up Test Conditions
Model
Description
Symbol
Value
Unit
Human Body
Series resistance
R1
1500
Ohm
Storage capacitance
C
100
pF
Number of pulse per pin
Positive
Negative
—
—
1
1
Charged Device Number of pulse per pin
Positive
Negative
—
—
3
3
Latch-up
Minimum input voltage limit
–2.5
V
Maximum input voltage limit
7.5
V
Table A-3. ESD and Latch-Up Protection Characteristics
Num
C
Rating
Symbol
Min
Max
Unit
1
C
Human Body Model (HBM)
V
HBM
2000
—
V
2
C
Charge Device Model (CDM) corner pins
Charge Device Model (CDM) edge pins
V
CDM
750
500
—
—
V
3
C
Latch-up current at T
A
= 125
°
C
Positive
Negative
I
LAT
+100
–100
—
—
mA
4
C
Latch-up current at T
A
= 27
°
C
Positive
Negative
I
LAT
+200
–200
—
—
mA
Because
of
an
order
from
the
United
States
International
Trade
Commission,
BGA-packaged
product
lines
and
part
numbers
indicated
here
currently
are
not
available
from
Freescale
for
import
or
sale
in
the
United
States
prior
to
September
2010:
S12XE
products
in
208
MAPBGA
packages
