Chapter 24 128 KByte Flash Module (S12XFTM128K2V1)
MC9S12XE-Family Reference Manual , Rev. 1.19
858
Freescale Semiconductor
24.3.2.12 EEE Tag Counter Register (ETAG)
The ETAG register contains the number of outstanding words in the buffer RAM EEE partition that need
to be programmed into the D-Flash EEE partition. The ETAG register is decremented prior to the related
tagged word being programmed into the D-Flash EEE partition. All tagged words have been programmed
into the D-Flash EEE partition once all bits in the ETAG register read 0 and the MGBUSY flag in the
FSTAT register reads 0.
All ETAG bits are readable but not writable and are cleared by the Memory Controller.
24.3.2.13 Flash ECC Error Results Register (FECCR)
The FECCR registers contain the result of a detected ECC fault for both single bit and double bit faults.
The FECCR register provides access to several ECC related fields as defined by the ECCRIX index bits
in the FECCRIX register (see
). Once ECC fault information has been stored, no other
011
HI
Data 1 [15:8]
LO
Data 1 [7:0]
100
HI
Data 2 [15:8]
LO
Data 2 [7:0]
101
HI
Data 3 [15:8]
LO
Data 3 [7:0]
Offset Module Base + 0x000C
7
6
5
4
3
2
1
0
R
ETAG[15:8]
W
Reset
0
0
0
0
0
0
0
0
= Unimplemented or Reserved
Figure 24-18. EEE Tag Counter High Register (ETAGHI)
Offset Module Base + 0x000D
7
6
5
4
3
2
1
0
R
ETAG[7:0]
W
Reset
0
0
0
0
0
0
0
0
= Unimplemented or Reserved
Figure 24-19. EEE Tag Counter Low Register (ETAGLO)
Table 24-26. FCCOB - NVM Command Mode (Typical Usage)
CCOBIX[2:0]
Byte
FCCOB Parameter Fields (NVM Command Mode)
Because
of
an
order
from
the
United
States
International
Trade
Commission,
BGA-packaged
product
lines
and
part
numbers
indicated
here
currently
are
not
available
from
Freescale
for
import
or
sale
in
the
United
States
prior
to
September
2010:
S12XE
products
in
208
MAPBGA
packages
