Device User Guide — 9S12DT128DGV2/D V02.16
135
Freescale Semiconductor
Table A-20 Expanded Bus Timing Characteristics
Conditions are shown in (Table A-4) unless otherwise noted, C
LOAD
= 50pF
Num C
Rating
Symbol
Min
Typ
Max
Unit
1
P Frequency of operation (E-clock)
f
o
0
25.0
MHz
2
P Cycle time
t
cyc
40
ns
3
D Pulse width, E low
PW
EL
19
ns
4
D Pulse width, E high
1
PW
EH
19
ns
5
D Address delay time
t
AD
8
ns
6
D Address valid time to E rise (PW
EL
–t
AD
)
t
AV
11
ns
7
D Muxed address hold time
t
MAH
2
ns
8
D Address hold to data valid
t
AHDS
7
ns
9
D Data hold to address
t
DHA
2
ns
10
D Read data setup time
t
DSR
13
ns
11
D Read data hold time
t
DHR
0
ns
12
D Write data delay time
t
DDW
7
ns
13
D Write data hold time
t
DHW
2
ns
14
D Write data setup time
(PW
EH
–t
DDW
)
t
DSW
12
ns
15
(t
cyc
–t
AD
–t
DSR
)
t
ACCA
19
ns
16
D E high access time
(PW
EH
–t
DSR
)
t
ACCE
6
ns
17
D Non-multiplexed address delay time
t
NAD
6
ns
18
D Non-muxed address valid to E rise (PW
EL
–t
NAD
)
t
NAV
15
ns
19
D Non-multiplexed address hold time
t
NAH
2
ns
20
D Chip select delay time
t
CSD
16
ns
21
D Chip select access time
cyc
–t
CSD
–t
DSR
)
t
ACCS
11
ns
22
D Chip select hold time
t
CSH
2
ns
23
D Chip select negated time
t
CSN
8
ns
24
D Read/write delay time
t
RWD
7
ns
25
D Read/write valid time to E rise (PW
EL
–t
RWD
)
t
RWV
14
ns
26
D Read/write hold time
t
RWH
2
ns
27
D Low strobe delay time
t
LSD
7
ns
28
D Low strobe valid time to E rise (PW
EL
–t
LSD
)
t
LSV
14
ns
29
D Low strobe hold time
t
LSH
2
ns
30
D NOACC strobe delay time
t
NOD
7
ns
31
D NOACC valid time to E rise (PW
EL
–t
NOD
)
t
NOV
14
ns
Summary of Contents for MC9S12A128
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