Freescale Semiconductor
MC9S12C-Family / MC9S12GC-Family
191
Rev 01.24
Chapter 7
Debug Module (DBGV1) Block Description
7.1
Introduction
This section describes the functionality of the debug (DBG) sub-block of the HCS12 core platform.
The DBG module is designed to be fully compatible with the existing BKP_HCS12_A module (BKP
mode) and furthermore provides an on-chip trace buffer with flexible triggering capability (DBG mode).
The DBG module provides for non-intrusive debug of application software. The DBG module is optimized
for the HCS12 16-bit architecture.
7.1.1
Features
The DBG module in BKP mode includes these distinctive features:
•
Full or dual breakpoint mode
— Compare on address and data (full)
— Compare on either of two addresses (dual)
•
BDM or SWI breakpoint
— Enter BDM on breakpoint (BDM)
— Execute SWI on breakpoint (SWI)
•
Tagged or forced breakpoint
— Break just before a specific instruction will begin execution (TAG)
— Break on the first instruction boundary after a match occurs (Force)
•
Single, range, or page address compares
— Compare on address (single)
— Compare on address 256 byte (range)
— Compare on any 16K page (page)
•
At forced breakpoints compare address on read or write
•
High and/or low byte data compares
•
Comparator C can provide an additional tag or force breakpoint (enhancement for BKP mode)
Summary of Contents for MC9S12C Family
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