Appendix A MCU Electrical Specifications
S12ZVHY/S12ZVHL Family Reference Manual Rev. 1.05
Freescale Semiconductor
779
A.1.6
Operating Conditions
This section describes the operating conditions of the device. Unless otherwise noted those conditions
apply to all the following data.
Table A-3. ESD and Latch-up Test Conditions
Model
Spec
Description
Symbol
Value
Unit
Human Body
JESD22-A114
Series Resistance
R
1500
Storage Capacitance
C
100
pF
Number of Pulse per pin
positive
negative
-
-
3
3
Charged- Device
JESD22-C101
Series Resistance
R
0
Storage Capacitance
C
4
pF
Latch-up for 5V
GPIO’s
Minimum Input Voltage Limit
-2.5
V
Maximum Input Voltage Limit
+7.5
V
Latch-up for
BCTL/VSENSE
LIN
Minimum Input Voltage Limit
-7
V
Maximum Input Voltage Limit
+21
V
Table A-4. ESD Protection and Latch-up Characteristics
Num
C
Rating
Symbol
Min
Max
Unit
1
C
Human Body Model (HBM):
-LIN vs LGND
-VSENSE vs VSS
-all other pins
V
HBM
+/-6
+/-4
+/-2
-
KV
2
C
Charged-Device Model (CDM):
Corner Pins
V
CDM
+/-750
-
V
3
C
Charged-Device Model (CDM):
all other pins
V
CDM
+/-500
-
V
4
C
Direct Contact Discharge IEC61000-4-2 with and
with out 220pF capacitor (R=330, C=150pF):
LIN vs LGND
V
ESDIEC
+/-6
-
KV
5
C
Latch-up Current of 5V GPIO’s at T= 27
C
positive
negative
I
LAT
+100
-100
-
mA
6
C
Latch-up Current of LIN , VSENSET and BCTL at
T= 27
C
positive
negative
I
LAT
+100
-100
-
mA
