IEEE 1149.1 Test Access Port (JTAG)
MCF52110 ColdFire® Integrated Microcontroller Reference Manual, Rev. 1
Freescale Semiconductor
28-7
Preliminary
Figure 28-4. TAP Controller State Machine Flow
28.4.3
JTAG Instructions
describes public and private instructions.
Table 28-5. JTAG Instructions
Instruction
IR[3:0]
Instruction Summary
EXTEST
0000
Selects boundary scan register while applying fixed values to output pins and
asserting functional reset
IDCODE
0001
Selects IDCODE register for shift
SAMPLE/PRELOAD
0010
Selects boundary scan register for shifting, sampling, and preloading without
disturbing functional operation
ENABLE_TEST_CTRL
0110
Selects TEST_CTRL register
RUN-TEST/IDLE
TEST-LOGIC-RESET
1
1
SELECT DR-SCAN
CAPTURE-DR
EXIT1-DR
PAUSE-DR
UPDATE-DR
SELECT IR-SCAN
SHIFT-DR
EXIT2-DR
CAPTURE-IR
SHIFT-IR
EXIT1-IR
PAUSE-IR
EXIT2-IR
UPDATE-IR
0
0
1
1
0
0
0
1
1
1
0
0
0
1
1
0
0
1
1
0
1
0
1
1
0
1
1
0
0
1
0