IEEE 1149.1 Test Access Port (JTAG)
Freescale Semiconductor
32-2
MCF52235 ColdFire® Integrated Microcontroller Reference Manual, Rev. 6
32.1.2
Features
The basic features of the JTAG module are the following:
•
Performs boundary-scan operations to test circuit board electrical continuity
•
Bypasses instruction to reduce the shift register path to a single cell
•
Sets chip output pins to safety states while executing the bypass instruction
•
Samples the system pins during operation and transparently shifts out the result
•
Selects between JTAG TAP controller and Background Debug Module (BDM) using a dedicated
JTAG_EN pin
32.1.3
Modes of Operation
The JTAG_EN pin can select between the following modes of operation:
•
JTAG mode (JTAG_EN = 1)
•
Background debug mode (BDM)—for more information, refer to
; (JTAG_EN = 0).
32.2
External Signal Description
The JTAG module has five input and one output external signals, as described in
32.2.1
JTAG Enable (JTAG_EN)
The JTAG_EN pin selects between the debug module and JTAG. If JTAG_EN is low, the debug module is
selected; if it is high, the JTAG is selected.
summarizes the pin function selected depending on
JTAG_EN logic state.
Table 32-1. Signal Properties
Name
Direction
Function
Reset State
Pull up
JTAG_EN
Input
JTAG/BDM selector input
—
—
TCLK
Input
JTAG Test clock input
—
Active
TMS/BKPT
Input
JTAG Test mode select / BDM Breakpoint
—
Active
TDI/DSI
Input
JTAG Test data input / BDM Development serial input
—
Active
TRST/DSCLK
Input
JTAG Test reset input / BDM Development serial clock
—
Active
TDO/DSO
Output
JTAG Test data output / BDM Development serial output
Hi-Z / 0
—
Because
of
an
order
from
the
United
States
International
Trade
Commission,
BGA-packaged
product
lines
and
part
numbers
indicated
here
currently
are
not
available
from
Freescale
for
import
or
sale
in
the
United
States
prior
to
September
2010:MCF52234CVM60,
MCF52235CVM60
