IEEE 1149.1-Compliant Interface (JTAG)
MPC561/MPC563 Reference Manual, Rev. 1.2
Freescale Semiconductor
25-29
1.Bi-state outputs (Pin Function = O) such as mdo_2, and mdo_3, are incorporated with general I/O pads hard-wired to keep
output enable always on in system mode. The JTAG Control cell, indicated by the next lower bsdl bit in the chain, is configured
as an “internal” only cell to be held at a “1” value (always driving out) during JTAG testing.
2. Some input-only cells made with generic I/O pads are configured with “internal” control cells to keep them always in input mode,
such as epee, b0epee, and input pins that may be attached to analog references. Other input-only cells are configured as
bidirectional for JTAG testing, to give the board-level ATPG tools the flexability to use the pad as an input or output, depending
on the network of other devices that the pin is connected too. If it is desired to restrict these pins to only act as receivers during
JTAG mode, then these JTAG bsdl entries can be converted as shown in the example below:
3. This description allows ATPG tools to use a pin as a driver or receiver:
4. A modification to restrict ATPG tools to use a functional input-only pin as an input receiver only:.
5. The PORESET, HRESET, and SRESET pins are not part of the JTAG boundary scan chain. These pins are used in the reset
configuration to enter JTAG. Board-level connections to them will not be testable with the EXTEST and CLAMP instructions.
They do respond to the HI-Z JTAG instruction for parametric testing purposes.6.
6. The XTAL, EXTAL, and XFC pins are associated with analog signals and are excluded from the boundary scan chain.
7. The READI module reset pin, rsti_b, (bsdl pin 517) is in the JTAG boundary scan chain, but must be kept at a “0” level during
JTAG testing, (except for Hi-Z testing), due to system interactions. It is classified as a “linkage” pin, and its data and control
cells are configured to advise ATPG tools to drive a “0” value in during JTAG testing.
8. Pad type naming conventions:
•26 V – 2.6 V
•5 V – 5 V
•s – slow
•f – fast
•h – high drive
•a – analog input
•i – input only
•d – has direct connection to the pad (may be used for module test)
417
BC_2
*
controlr
0
418
BC_7
IRQ4_B_AT2_SGPIOC4
bidir
0
417
0
Z
IO
26v5vs
419
BC_2
*
controlr
0
420
BC_7
IRQ3_B_KR_B_RETRY_B_
SGPIOC3
bidir
0
419
0
Z
IO
26v5vs
421
BC_2
*
internal
1
422
BC_2
IWP0_VFLS0
output2
1
O
26v
423
BC_2
*
internal
1
424
BC_2
IWP1_VFLS1
output2
1
O
26v
425
BC_2
*
controlr
0
426
BC_7
SGPIOC6_FRZ_PTR_B
bidir
0
425
0
Z
IO
26v5vs
188
BC_2
*
controlr
0
189
BC_7
irq6_b_modck2
bidir
0
188
0
Z
I
26v
188
BC_2
*
internal
0
189
BC_4
irq6_b_modck2
input
X
I
26v
Table 25-2. MPC563 Boundary Scan Bit Definition (continued)
BSDL
Bit
Cell
Type
Pin/Port Name
BSDL
Function
Safe
Value
Contro
l
Cell
Disable
Value
Disabl
e
Result
Pin
Functio
n
Pad
Type
Summary of Contents for MPC561
Page 84: ...MPC561 MPC563 Reference Manual Rev 1 2 lxxxiv Freescale Semiconductor...
Page 144: ...Signal Descriptions MPC561 MPC563 Reference Manual Rev 1 2 2 46 Freescale Semiconductor...
Page 206: ...Central Processing Unit MPC561 MPC563 Reference Manual Rev 1 2 3 62 Freescale Semiconductor...
Page 302: ...Reset MPC561 MPC563 Reference Manual Rev 1 2 7 14 Freescale Semiconductor...
Page 854: ...Time Processor Unit 3 MPC561 MPC563 Reference Manual Rev 1 2 19 24 Freescale Semiconductor...
Page 968: ...Development Support MPC561 MPC563 Reference Manual Rev 1 2 23 54 Freescale Semiconductor...
Page 1144: ...Internal Memory Map MPC561 MPC563 Reference Manual Rev 1 2 B 34 Freescale Semiconductor...
Page 1212: ...TPU3 ROM Functions MPC561 MPC563 Reference Manual Rev 1 2 D 60 Freescale Semiconductor...
Page 1216: ...Memory Access Timing MPC561 MPC563 Reference Manual Rev 1 2 E 4 Freescale Semiconductor...