MPC563XM Reference Manual, Rev. 1
Freescale Semiconductor
79
Preliminary—Subject to Change Without Notice
3.3.3.7
MDO[2]_eTPU_A[21]_GPIO[222] — Nexus Message Data Out / eTPU_A
Channel / GPIO
Is the trace message output to the development tools. The alternate functions are output channel for
eTPU_A[21] module and GPIO[222].
3.3.3.8
MDO[3]_eTPU_A[25]_GPIO[223] — Nexus Message Data Out / eTPU_A
Channel / GPIO
Is the trace message output to the development tools. The alternate functions are output channel for
eTPU_A[25] module and GPIO[223].
3.3.3.9
MSEO[0]_eTPU_A[27]_GPIO[224] — Nexus Message Start/End Out /
eTPU_A Channel / GPIO
Is the output that indicate when messages start and end on the MDO pins. The alternate functions are
output channel for eTPU_A[27] module and GPIO[224].
3.3.3.10
MSEO[1]_eTPU_A[29]_GPIO[225] — Nexus Message Start/End Out /
eTPU_A Channel / GPIO
Is the output that indicates when messages start and end on the MDO pins. The alternate functions are
output channel for eTPU_A[29] module and GPIO[225].
3.3.4
JTAG
3.3.4.1
TCK — JTAG Test Clock Input
TCK provides the clock input for the on-chip test logic.
3.3.4.2
TDI_eMIOS[5]_GPIO[232] — JTAG Test Data Input
TDI provides the serial test instruction and data input for the on-chip test logic. The alternate functions are
output channel for eMIOS[5] module and GPIO[232].
3.3.4.3
TDO_eMIOS[6]_GPIO[228] — JTAG Test Data Output
TDO provides the serial test data output for the on-chip test logic. The alternate functions are output
channel for eMIOS[6] module and GPIO[228].
3.3.4.4
TMS — JTAG Test Mode Select Input
TMS controls test mode operations for the on-chip test logic.
3.3.4.5
JCOMP — JTAG Compliance Input
The JCOMP pin is used to enable the JTAG TAP controller.