Freescale Semiconductor
32-1
PXR40 Microcontroller Reference Manual, Rev. 1
Chapter 32
IEEE 1149.1 Test Access Port Controller (JTAGC)
32.1
Introduction
The JTAG port of the device consists of four inputs and one output. These pins include JTAG compliance
select (JCOMP), test data input (TDI), test data output (TDO), test mode select (TMS), and test clock input
(TCK). TDI, TDO, TMS, and TCK are compliant with the IEEE 1149.1-2001 standard and are shared with
the NDI through the test access port (TAP) interface.
32.1.1
Block Diagram
is a block diagram of the JTAG Controller (JTAGC).
Figure 32-1. JTAG Controller Block Diagram
TCK
TMS
TDI
Test access port (TAP)
TDO
32-bit device identification register
Boundary scan register
.
.
controller
1-bit bypass register
.
5-bit TAP instruction decoder
5-bit TAP instruction register
.
.
.
JCOMP
Power-on
reset
Summary of Contents for PXR4030
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