GE H
EALTHCARE
D
IRECTION
FQ091013, R
EVISION
1
V
IVID
I
N
AND
V
IVID
Q
N S
ERVICE
M
ANUAL
Chapter 7 - Diagnostics/Troubleshooting
7-11
7-2-4-2
Front End Tests
NOTE:
The Front End Tests may be performed in any order. However, due to the functional dependencies
between each of the Front End boards, it is recommended to perform the tests on the boards in the
following order (as described in the Performing Front End (FE) Diagnostics section, on page 7-24):
1.) RFI board
2.) TR32 boards
3.) PM board
Performing the tests in the proper sequence will help to derive the correct conclusions regarding the
source of the problem.
7-2-4-2-1
Calibration
•
DC Offset Calibration
This is used to test proper operation of the Beamformer, and TR32A and TR32B boards. The test
generates no signal at the input to the Beamformer and is used to calibrate the system, or to test
system calibration in order to check that the current calibration values are valid for the current
environment.
For test procedure instructions, see the
DC Offset Calibration section, page 7-25
.
•
DC Offset Verification
This test verifies that the calibration saved on the Hard Disk is within acceptable limits.
For test procedure instructions, see the
DC Offset Verification section, page 7-28
7-2-4-2-2
RFI Tests
•
Full RFI Test
The Full RFI Test performs a complete test sequence and includes all the RFI board tests
(described below).
For test procedure instructions, see the
Full RFI Test section, page 7-31
•
RFI FE Cache Test
Tests the cache memory. (The cache memory for the PM, TR32A, TR32B and the RFI boards is
located on the RFI board). This test sends a specific pattern into the cache memory and the
expected result is to see a predefined pattern as the output from the cache memory.
For test procedure instructions, see the
RFI FE Cache Test section, page 7-34
.
•
RFI Analog Circuits Test
This tests the RFI analog circuitry (which is responsible for temperature monitoring and
communication with the TEE probe).
For test procedure instructions, see the
RFI Analog Circuits Test section, page 7-37
.
•
RFI Demodulator Short Test
This is used to perform a short digital test on the demodulator to make sure that the demodulator
on the FPGA is functioning in accordance with the specifications.
For test procedure instructions, see the
RFI Demodulator Short Test section, page 7-40
•
RFI Audio Test
This tests the audio frequency for Doppler sound (coming from the RFI board to the Back End).
During this test - approximately midway on the progress bar - a loud, high-pitched sound will be
heard coming from the speakers.
For procedure details, see the
RFI Audio Test section, page 7-43
.
Note:
To conduct a complete audio test of the system, it is also necessary to perform an audio
test which is part of the Back End - for details, refer to the
Summary of Contents for Vivid in
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