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48
Hardware Development Guide
ME3616
Table 6-2 Testing Environment
Working Condition
Min Temperature
Max Temperature
Remark
Normal working condition
-30°C
75°C
All the indexes are good.
Extreme working condition
-40~ -30°C
75~85°C
Some indexes become poorer.
Storage
-40°C
85°C
Storage environment of module
Table 6-3 Testing Instrument & Device
Testing Item
Instrument & Device
RF test
Comprehensive testing device
RF cable
Tower antenna
Microwave darkroom
High/Low-temperature running & storage test
High/Low-temperature experimental box
Temperature shock test
Temperature shock experimental box
Vibration test
Vibration console
6.3.
R
ELIABILITY
T
ESTING
E
NVIRONMENT
The reliability test includes the vibration test, high/low-temperature running, high/low-temperature storage and temperature
shock experiment test. Refer to
Table 6-4
for the specific parameters.
Table 6-4 Reliability Features
Test Item
Test Condition
Test Standard
Random vibration
Frequency range: 5-20Hz, PSD: 1.0m2/s3
Frequency range: 20-200Hz, -3dB/oct
3 axis, 1 hour for each axis
IEC 68-2-6
Temperature shock
Low temperature: -40°C ± 2°C
High temperature: +80°C ± 2°C
Temperature changing period: less than 30s
Test duration: 2 hours Cycle: 10
IEC 68-2-14 Na
High-temperature running
Normal high temperature: 75 °C
Extreme high temperature: 85°C
Duration: 24 hours
GOSUNCN standard
Low-temperature running
Normal low temperature: -30°C
Extreme low temperature: -40°C
Duration: 24 hours
GOSUNCN standard
High temperature & high humidity
Temperature: +60°C
Humidity: 95%
Duration: 48 hours
GOSUNCN standard
High temperature storage
Temperature: 85°C
Duration: 24 hours
IEC 68-2-1 Ab
Low temperature storage
Temperature: -40°C Duration: 24 hours
IEC 68-2-2 Bb