Subject to change without notice
11
2. 4. Screen settings
2. 4. 1. Adjusting the trace rotation
Due to influences of the magnetic earth field it may be necessary to
compensate an angular misalignment of the trace. To adjust the trace into
its horizontal position (in parallel to the bottom grid line) turn the TR
potentiometer
(13)
located below the CRT screen with a small screwdriver.
The DUT function may not be activated during this procedure.
2. 4. 2. Adjusting Y-POS./X-POS.
Normally the readjustment of the X and Y position of the trace is not
necessary. However, if the left end of the trace is not aligned to the lower
left corner of the grid you should adjust it to start at this point. To perform
this procedure use the Y-POS. and the X-POS. screws, which are located
below the CRT screen at the front panel of the instrument.
3. Performing device tests
As soon as the
HM6042
is switched on, a baseline is visible at the CTR
screen as long as no DUT (Device Under Test) is inserted. A bright spot on
the line indicates the current cursor position.
The standard device adapter, as supplied with each
HM6042
, is to be
mounted to the instrument using the banana jack combination
(17)
at the
front panel of the instrument. The terminals are designated as E/S (Emit-
ter/Source), C/D (Collector/Drain), and B/G (Base/Gate).
This adapter is able to carry two DUTs; with the help of the instrument’s
memory function (see chapter 4. 3) and the device adapter’s toggle switch
device selections and component matching tests can be performed easily.
On request other device adapters are available from
HAMEG
to be used
on the
HM6042
instrument.
If the standard device adapter is not suitable for special test purposes a
DUT can be connected to the terminals using ordinary test cables. Their
maximum length is limited to 25 cm each. The measurement accuracy of
the instrument however can be degraded due to hum and noise on the
cables. The use of shielded cables is not recommended because of their
relatively high stray capacitance.
When using single wire connections extreme care has to be taken for
safety purposes.
For testing diodes please use terminal E and C
(17)
and set the BIP/FET
switch
(15)
to position FET (locked).
To start a test the push button DUT
(14)
has to be pressed. Immediately,
the value of the selected parameter appears on the LCD.