5K250 (SATA) OEM Specification
Page 109 of 171
14.16.3.2
Self-test descriptor index
This indicates the most recent self-test descriptor. If there have been no self-tests, this is set to zero.
Valid values for the Self-test descriptor index are 0 to 18.
14.16.3.3
Extended Self-test log descriptor entry
The content of the self-test descriptor entry is shown below.
Description
Bytes
Offset
Self-test number
1
00h
Self-test execution status
1
01h
Power-on life timestamp in hours
2
02h
Self-test failure check point
1
04h
Failing LBA (7:0)
1
05h
Failing LBA (15:8)
1
06h
Failing LBA (23:16)
1
07h
Failing LBA (31:24)
1
08h
Failing LBA (39:32)
1
09h
Failing LBA (47:40)
1
0Ah
Vendor specific
15
0Bh
26
Table 79 Extended Self-test log descriptor entry
14.16.4
Command Error
The following table defines the format of
the Command Error data structure
.
Byte
7
6 5 4 3 2 1 0
0
NQ
Rsv Rsv
TAG
1
Reserved
2
Status
3
Error
4
LBA Low
5
LBA Mid
6
LBA High
7
Device
8
LBA Low Previous
9
LBA Mid Previous
10
LBA High Previous
11 Reserved
12 Sector
Count
13 Sector
Count
Previous
14 – 255
Reserved
256 – 510
Vendor Unique
511 Data
Structure
Checksum
Table 80 Command Error information
The TAG field (Byte 0 bits 4-0) contains the tag number corresponding to a queued command, if the
NQ bit is cleared.
The NQ field (Byte 0 bit 7) indicates whether the error condition was a result of a non-queued or not.
If it is cleared, the error information corresponds to a queued command specified by the tag number
indicated in the TAG field.