Verification of the low voltage magnitude blocking
M16290-34 v6
1.
Check that the settings in the IED are appropriate, for example the
StartFrequency
and the
tDelay
.
2.
Supply the IED with three-phase voltages at their rated values.
3.
Slowly decrease the magnitude of the applied voltage, until the BLKDMAGN signal appears.
4.
Note the voltage magnitude value and compare it with the set value.
5.
Slowly increase the frequency of the applied voltage, to a value above
StartFrequency
.
6.
Check that the START signal does not appear.
7.
Wait for a time corresponding to
tDelay
, make sure that the TRIP signal does not appear.
11.7.2.2
Completing the test
M16290-52 v5
Continue to test another function or end the test by changing the
TESTMODE
setting to
Off
. Restore
connections and settings to the original values, if changed for testing purposes.
11.7.3
Rate-of-change frequency protection SAPFRC
M16256-2 v6
Prepare the IED for verification of settings as outlined in section
11.7.3.1
Verifying the settings
M16256-8 v1
Verification of START value and time delay to operate
M16256-10 v5
1.
Check that the settings in the IED are appropriate, especially the START value and the definite
time delay. Set
StartFreqGrad
, to a rather small negative value.
2.
Supply the IED with three-phase voltages at their rated values.
3.
Slowly decrease the frequency of the applied voltage, with an increasing rate-of-change that
finally exceeds the setting of
StartFreqGrad
, and check that the START signal appears.
4.
Note the operate value and compare it with the set value.
5.
Increase the frequency to rated operating conditions, and zero rate-of-change.
6.
Check that the START signal resets.
7.
Instantaneously decrease the frequency of the applied voltage to a value about 20% lower than
the nominal value.
8.
Measure the time delay for the TRIP signal, and compare it with the set value.
Extended testing
M16256-29 v4
1.
The test above can be repeated to check a positive setting of
StartFreqGrad
.
2.
The tests above can be repeated to check the time to reset.
3.
The tests above can be repeated to test the RESTORE signal, when the frequency recovers
from a low value.
11.7.3.2
Completing the test
M16256-39 v4
Continue to test another function or end the test by changing the
TESTMODE
setting to
Off
. Restore
connections and settings to the original values, if changed for testing purposes.
11.7.4
Frequency time accumulation protection function FTAQFVR
GUID-F7BD8E10-EF88-4698-87F4-0D4365004705 v2
Prepare the IED for verification of settings as outlined in section “Overview” and section “Preparing
for test” in this chapter.
1MRK 511 403-UEN Rev. L
Section 11
Testing functionality by secondary injection
Bay control REC670
145
Commissioning manual
© 2017 - 2022 Hitachi Energy. All rights reserved
Summary of Contents for REC670
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