109
PEB383 User Manual
July 25, 2011
Integrated Device Technology, Inc.
Confidential - NDA Required
13. JTAG
Topics discussed include the following:
•
•
“TAP Controller Initialization”
•
•
•
•
•
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“Accessing SerDes TAP Controller”
13.1
Overview
The JTAG Interface is compliant with IEEE 1149.6 B
oundary Scan Testing of Advanced Digital
Networks
,
as well as IEEE 1149.1
Standard Test Access Port and Boundary Scan Architecture
standards. There are five standard pins associated with the interface (JTAG_TMS, JTAG_TCK,
JTAG_TDI, JTAG_TDO, and JTAG_TRSTn) that allow full control of the internal TAP (Test Access
Port) controller.
The JTAG Interface has the following features:
•
Contains a 5-pin Test Access Port (TAP) controller, with support for the following registers
— Instruction register (IR)
— Boundary scan register
— Bypass register
— Device ID register
— User test data register (DR)
•
Supports debug access of the PEB383’s configuration registers
— During mission mode or not
— Bus arbitration with configuration cycles
•
Supports the following instruction opcodes
— Sample/Preload
— Extest
— EXTEST_PULSE
(1149.6)
— EXTEST_TRAIN
(1149.6)