11. Signals and Pinout
204
PowerSpan II User Manual
80A1010_MA001_09
Integrated Device Technology
www.idt.com
TDO
Tristate output
(LVTTL)
Hi-Z
-
Test Data Output (JTAG):
Used
(in conjunction with TCK) to shift
data and instructions into the Test
Access Port (TAP) in a serial bit
stream.
TRST_
Input
(LVTTL)
(Schmitt trigger)
Internal pull-up
resistor
Pull-down resistor if
JTAG is not used in
the system.
Otherwise the signal
must be toggled with
the PO_RST_
signal.
Test Reset (JTAG):
Asynchronous reset for the JTAG
controller. This pin must be
asserted during the power-up
reset sequence to ensure that the
Boundary Scan Register
elements are configured for
normal system operation.
Customers must assert TRST
_concurrently with PO_RST_ as
part of the power-up reset
sequence.
TE
Input
Internal pull-down
resistor
Pull-down resistor
Test Enable:
Enables
manufacturing test. IDT
recommends that system
designers pull this signal low.
Table 59: Test Signals
Pin Name
Pin Type
Reset State
Recommended
Termination
Description