11. Signals and Pinout
203
PowerSpan II User Manual
80A1010_MA001_09
Integrated Device Technology
www.idt.com
11.1.6
Test Signals
lists PowerSpan II signals used to support silicon or board level testing.
Table 59: Test Signals
Pin Name
Pin Type
Reset State
Recommended
Termination
Description
PI_TEST1
Input
Internal pull-down
resistor
Pull-down resistor
PLL Test 1:
Internal PLL test
signal. This is for internal IDT
use.
PI_TEST2
Input
Internal pull-down
resistor
Pull-down resistor
PLL Test 2:
Internal PLL test
signal. This is for internal IDT
use.
P2_TEST1
Input
Note:
This signal is
present in both the
Single PCI
PowerSpan II and
the Dual PCI
PowerSpan II. The
signal is used for
both PCI-1 and
PCI-2 internal
testing.
Internal pull-down
resistor
Pull-down resistor
PLL Test 1:
Internal PLL test
signal. This is for internal IDT
use.
P2_TEST2
Input
Internal pull-down
resistor
Pull-down resistor
PLL Test 2:
Internal PLL test
signal. This is for internal IDT
use.
PB_TEST1
Input
Internal pull-down
resistor
Pull-down resistor
PLL Test 1:
Internal PLL test
signal. This is for internal IDT
use.
PB_TEST2
Input
Internal pull-down
resistor
Pull-down resistor
PLL Test 2:
Internal PLL test
signal. This is for internal IDT
use.
TCK
Input
(LVTTL)
Hi-Z
-
Test Clock (JTAG):
Used to
clock state information and data
into and out of the device during
boundary scan.
TMS
Input
(LVTTL)
Internal pull-up
resistor
-
Test Mode Select (JTAG)
: Used
to control the state of the Test
Access Port controller
TDI
Input
(LVTTL)
Internal pull-up
resistor
-
Test Data Input (JTAG):
Used
(in conjunction with TCK) to shift
data and instructions into the Test
Access Port (TAP) in a serial bit
stream.