Data Sheet
170
Rev. 1.00
2017-07-31
TLE9262BQXV33
Application Information
17.2
ESD Tests
Note:
Tests for ESD robustness according to IEC61000-4-2 “gun test” (150pF, 330
Ω
) has been performed.
The results and test conditions are available in a test report. The target values for the test are listed
in
Table 32
below.
EMC and ESD susceptibility tests according to SAE J2962-2 (2010) have been performed. Tested by external
test house (UL LLC).
Table 32 ESD
“Gun
Test”
Performed Test
Result
Unit
Remarks
ESD at pin CANH, CANL,
LIN, VS, WK1..3, HSx, VCC2,
VCC3 versus GND
>6
kV
1)2)
positive pulse
1) ESD Test “Gun Test” is specified with external components for pins VS, WK1..3, HSx, VCC3 and VCC2. See the
application diagram in
Chapter 17.1
for more information.
2) ESD susceptibility “ESD GUN” according LIN EMC 1.3 Test Specification, Section 4.3 (IEC 61000-4-2). Tested by external
test house (IBEE Zwickau, EMC Test report Nr. 04-01-17)
ESD at pin CANH, CANL,
LIN, VS, WK1..3, HSx, VCC2,
VCC3 versus GND
< -6
kV
1)2)
negative pulse
