Intel
®
5100 MCH Chipset
Intel
®
5100 Memory Controller Hub Chipset for Communications, Embedded, and Storage Applications
TDG
July 2008
30
Order Number: 318676-003US
6.2.2
Thermal Solution Performance Characteristics
Figure 22
shows the performance of the CompactPCI* reference heatsink. This figure
shows the thermal performance of the heatsink versus the airflow approach velocity
provided.
7.0
Reliability Guidelines
Each motherboard, heatsink, and attach combination may vary the mechanical loading
of the component. The user should carefully evaluate the reliability of the completed
assembly prior to use in high volume. Some general recommendations are shown in
Table 8
.
Figure 22.
CompactPCI* Reference Heatsink Thermal Performance
0
0.5
1
1.5
2
2.5
3
3.5
4
0
100
200
300
400
500
600
700
800
900
1000 1100 1200
Airflow Approach Velocity (LFM)
Case-
T
o
-A
m
b
ie
n
t T
h
erm
a
l C
h
aract
eri
z
at
io
n
P
a
ra
m
e
te
r
Ψ
ca
(
o
C/
W
)
CompactPCI* Heatsink
Table 8.
Reliability Requirements
Test
1
Requirement
Pass/Fail Criteria
2
Mechanical Shock
50 g, board level, 11 ms, three shocks/axis
Visual Check and Electrical Functional Test
Random Vibration
7.3 g, board level, 45 minutes/axis, 50 Hz to 2000 Hz
Visual Check and Electrical Functional Test
Temperature Life
85 °C, 2000 hours total, checkpoints at 168, 500, 1000,
and 2000 hours
Visual Check
Thermal Cycling
-5 °C to +70 °C, 500 cycles
Visual Check
Humidity
85% relative humidity, 55 °C, 1000 hours
Visual Check
Notes:
1.
The above tests should be performed on a sample size of at least 12 assemblies from three lots of material.
2.
Additional pass/fail criteria may be added at the discretion of the user.