TMPM5200-2
5-41
.4.3 V
Visco
ity image obs
an option
t requ
plifier
supplied to order. Conne
plifier to the SPM controller and set the
softw
ce wi
re in Section 5.2.5, “Lock-in amplifier.”
Usua
erve a v
elasticity image using Contact mode. Depending on the
sample, however, you may not be able to obtain a good image. You can obtain only
perturbed images due to
cantilever to the sample. To avoid this
problem, use AC mode. Then you can obtain good results. Viscoel sticity observation in
AC
difference between the resonance
frequency (about 300 kHz) of the cantilever a d the modulation fr quency (several tens
of kHz) for viscoelasticity observation.
■
Mounti
In or
fix the sample
rmly to the specimen stub using conductive paste instead of double-faced tape.
5
E-AFM
Tab
elastic
ervation is
al function tha
ires a lock-in am
ct the lock-in am
th the procedu
are in accordan
lly you obs
isco
the adhesion of the
a
mode will be performed through use of the
n
e
ng a sample
der to observe a viscoelasticity image correctly, it is essential to af
fi
Specimen
Conductive paste
Specimen stub
■
Confirmation before an approach
Affix the specimen, adjust the laser and photodiode, and then perform the coarse
approach according to the procedure in Section 5.4.1, “Approach.”
