PAGE 99 of 177
CX0344 Rev 05.3
2.
Pull the latch pin
(Fig. 232)
and slowly lower the probe holder to the scan
surface
(Fig. 233)
.
NOTE:
The probe holder must be lifted slightly to pull and release the latch pin.
5.8.6.1 Latch Pin
The latch pin may be used in one of
two methods:
1.
Slightly lift the probe holder
(Fig. 231).
2.
Pull the latch pin to allow
movement of the probe holder
(Fig. 234)
.
3.
Release latch pin and probe
holder will lock when lifted to the
upper most position.
Method two allows free movement
of the probe holder along the entire
length of the stroke without locking
in place at the upper most position:
4.
Slightly lift the probe holder
(Fig. 231).
5.
Pull the latch pin and slightly
rotate the latch pin left or right
(Fig. 235)
.
6.
Release the latch pin and
probe holder movement is now
available through the entire
Fig. 233 - Lower probe to inspection surface
Fig. 234 - Pull latch pin
1
2
Fig. 235 - Pull latch pin and rotate
