Section 4: Multi-frequency capacitance-voltage unit
Model 4200A-SCS Parameter Analyzer Reference Manual
4-34
4200A-901-01 Rev. C / February 2017
Projects
Description
(on page 4-93)
Measures both I-V and C-V. A SMU is used to measure the forward-biased
characteristics of an illuminated solar cell and extract parameters (such as
maximum power, maximum current, maximum voltage, short-circuit current, open-
circuit voltage, and efficiency). The SMU also makes a reverse biased I-V
measurement and performs C-V and C-f sweeps.
(on page 4-100)
Summarizes the C-V tests that have been added to the default project. C-V testing
for an n-MOSFET, diode, and a capacitor.
Capacitor I-V and C-V Measurements with Series 700 Project (cap-iv-
cv-matrix)
This project demonstrates how to use a Series 700 Switching System to automate I-V and C-V testing
of a capacitor. When you run the project, the switching matrix connects two 4200-SMUs to the
capacitor, as shown in the following figure, and I-V measurements are made.
Figure 117: Switching matrix signal path for I-V testing
