Section 4: Multi-frequency capacitance-voltage unit
Model 4200A-SCS Parameter Analyzer Reference Manual
4-40
4200A-901-01 Rev. C / February 2017
Figure 122: Basic configurations for BJT c-be0 test
Formulas and constants
This project uses two formulas with no constants:
•
AVG_CAP: Calculates the average capacitance in farads (F). The formula is:
AVG_CAP = AVG(CP_AB)
•
STD_DEV: Calculates the standard deviation of the capacitance measurements. The formula is:
STD_DEV = STDEV(CP_AB)
c-cb0 test
This test measures the capacitance as a function of time between the collector and base terminals of
a BJT at 0 V. The results (C versus t) are then plotted on a graph. This test also calculates the
average capacitance and standard deviation.
Analyze sheet
Test data is displayed in the Analyze sheet:
•
Time: Measured parallel capacitance.
•
Cp_CB: Measured parallel capacitance.
•
Gp_CB: Measure conductance.
•
DCV_CB: Forced DC bias voltage.
•
F_CB: Forced test frequency.
•
CVU1S: Status code for each measurement. Rows highlighted in blue indicate a fault. For details,
see
(on page 6-191).
•
AVG_CAP: Calculated; the average capacitance in farads (F).
•
STD_DEV: Calculated; the standard deviation of the capacitance measurements.
