Model 4200A-SCS Parameter Analyzer Reference Manual
Index
4200A-901-01 Rev. C / February 2017
Index-5
cv-sd test • 4-91
cv-sweep • 4-75, 4-76
cvsweep test description • D-19
CvSweep4294 user module • 6-332
CvSweep4980 user module • C-12
CvSweep590 user module • B-30
example • B-10
cvsweep-diode test • 4-96
cvsweep-solarcell test • 4-103
CVU connection notes • 4-6
CVU Frequency Sweep (bias) • 4-30
CVU Frequency Sweep (step) • 4-32
CVU Real-Time Measure Mode • 4-19
CVU Terminal Settings - Advanced • 4-33
CVU typical test connections • 4-7
CVU Voltage Bias • 4-26
CVU Voltage List Sweep • 4-28
CVU Voltage Sweep • 4-27
cvu-bjt • 4-41
cvu-bjt connections • 4-42
cvu-bjt-cviv project • 4-45
cvu-capacitor connections • 4-74
cvu-highv project • 4-46
cvu-moscap • 4-47, 4-50
cvu-moscap project formulas and constants • 4-50,
4-57
cvu-nanowire connections • 4-90
cv-vfb1 test • 4-80
cv-vfb2 test • 4-81
cv-vfb3 test • 4-83
Cycle Mode • 6-242
D
data
analysis and graphing tools • 6-198
arrays, creating a user module • 8-28
clear buffer • 9-45, 9-46, 9-47, 9-48, 9-49
format for system mode readings • 9-53
format for user mode readings • 9-54
select for analysis • 6-289
series properties • 6-239
type, specify • 8-5
variables, selecting • 6-234
worksheet for the VSweep user module (KULT) •
8-35
Data Type field • 8-5
Data Variables • 6-234
DC bias characteristics • 4-4
debug task, loading (KULT) • 8-68
debug user modules with Microsoft Visual C++ .NET
• 8-65
debug, KULT • 8-66
default
project • 6-358
Default, Min, and Max fields • 8-5
define
axis properties of the graph • 6-218
Device Initialize • 13-27
ITM • 6-13
define a UTM
Open Module (KULT) • 8-10
definition • 6-215
Degradation Targets • 6-166
del_lib subcommand (KULT) • 8-57
delay • 13-15
delete
GPIB definition strings • 13-26
subsite • 6-12
dependent user libraries, building (KULT) • 8-63
depletion region • 4-49
description
status bar (KULT) • 8-8
tab area (KULT) • 8-7
Device Initialize • 13-16
Device Library - add device • 6-320
Device Plan
Device Plan
Selecting • 6-153, 6-191, 6-193, 6-194, 6-195, 6-
320, G-28, H-21, I-5
guarding • 2-2
shielding • 2-2
stress properties • L-3, L-5, L-7
device, add to library • 6-320
dialog box test examples (KULT) • 8-72
dialog boxes • 8-70
Die Map dialog • G-22
Die program tools window • H-8, H-17
die, calculating sizes • H-17
dielectric absorption • 12-14
diode c-2vsv test • 4-97
diode tests • 6-361
diode-dopingprofile test • 4-97
diode-project • 4-93, 4-95
directories and files • 11-3
discrete pulses • 5-4
display
a legend for color coded plots • 6-235
Formulator function reference • 6-249
graph comment in default position • 6-232
legend, add • 6-235
title • 6-237
display, brightness control • 12-2
DisplayCableCompCaps590 user module • B-34
DisplayCableCompCaps82 user module • D-40
Duplicate a project • 6-20
DUT • A-16, A-17, A-21, A-24
DUT resistance determines pulse voltage • 5-67
E
edit locking • 8-64
