Section 6: Clarius
Model 4200A-SCS Parameter Analyzer Reference Manual
6-170
4200A-901-01 Rev. C / February 2017
Set up Segment Stress/Measure mode
Segment stress/measure testing consists of two phases:
•
During a measure phase, the system make measurements on the DUT.
•
During a stress phase, the Keithley pulse card provides stress using Segment Arb waveforms,
and the SMUs provide voltage bias and current limit. There are no measurements made during
the stress phase.
For Segment Arb stressing, the waveform period is the fundamental unit of time for stressing. In the
setup pane, the term "stress counts" is used to specify the number of times the Segment Arb
waveform will stress the device. For example, assume the stress count is three, and the waveform
period is four seconds. For that stress cycle, the Segment Arb waveform will stress the device three
times for a total stress time of twelve seconds.
In a typical stress/measure test system that uses a switch matrix to automate the stress and measure
phases of the test:
•
During a measure phase, the switch matrix connects the instruments that will make the
measurements on the DUT. The Keithley Instruments pulse card is disconnected from the DUT
during a measure phase.
•
During a stress phase, the switch matrix connects the pulse generator to the DUT. It also
connects SMUs that will be used for device pin grounding or biasing.
If your system contains 4225-RPMs, you cannot use SMUs during segment stresses. You must
disconnect all RPMs from the 4200A-SCS and update the RPM configuration in KCon to enable DC
biasing during subsite segment stress.
To effectively transmit the higher frequency components of the typical pulse (Segment Arb or
Standard), a high-bandwidth switch matrix card should be used (for example, Keithley Instruments
7174A).
To set up stress/measure mode testing, you need to:
•
Set up segment stress/measure counts
(on page 6-171)
•
Set the segment stress/measure mode Subsite Stress Properties
(on page 6-175)
