Model 4200A-SCS Parameter Analyzer Reference Manual
Section 6: Clarius
4200A-901-01 Rev. C / February 2017
6-189
Stress/measure mode Analyze graph
The graphs for the stress/measure mode plot degradation (in %) versus the stress times. Each data
point in the graph represents the device degradation (% Change) for tests after each stress cycle
(stress time).
The graph below traces for test
id#1
for the
4terminal-n-fet
device. The three traces are for
Output Values I
DOFF
, I
DLIN
, and I
DSAT
.
The options at the bottom of the graph allow you to change which device and test data is graphed.
The options are:
•
Device:
Select the device for which to display data. For a single-device subsite, this option is not
available.
•
Overlay All Devices:
Select this option to display all the graph traces for all devices that were
measured by the selected test. For a single-device subsite, this option is not available.
•
Test:
Select the test for which to display data.
The output values for each test can be graphed as shown in the following figure.
Figure 350: Stress/measure mode graph
