In this appendix:
Typical test systems using a switch matrix ............................... A-1
Switch matrix connections ........................................................ A-7
Connection scheme settings .................................................. A-12
Switch matrix control .............................................................. A-16
Signal paths to a DUT ............................................................ A-17
Use KCon to add a switch matrix to the system ..................... A-24
Switch matrix control example ................................................ A-30
Matrixulib user library ............................................................. A-32
Typical test systems using a switch matrix
A switch matrix enhances the connectivity of the 4200A-SCS by allowing any SMU or preamplifier
signal to be connected to any DUT pin. This section summarizes recommended switching
mainframes and matrix cards, and shows typical connecting schemes with SMUs and preamplifiers.
A switch matrix provides automatic switching for test instrumentation and devices under test (DUTs).
Typical switch matrix systems are shown in the following figure.
The 4200A-SCS supports the Keithley Instruments Series 700 Switching System as external
instruments. This series includes the 707, 707A, and 707B, which have six slots for matrix cards. This
provides up to 72 pins of switching. This series also includes the 708, 708A, and 708B, which support
a single matrix card for 12 pins of matrix switching.
When using a switch matrix, one probe station or one test fixture must be present in the system
configuration because the probe station or test fixture establishes the number of test-system pins.
The matrix is cabled to the test system pins, and instrument terminals are routed through the matrix to
the pins using the user modules in the
Matrixulib
user library.
The following figure shows switch matrix cards connected to a probe station in order to test a wafer.
However, a probe station could be replaced by a test fixture to test discrete devices.
Appendix A
Using switch matrices
