Model 4200A-SCS Parameter Analyzer Reference Manual
Appendix L: Wafer-level reliability testing
4200A-901-01 Rev. C / February 2017
L-5
Negative Bias Temperature Instability project
The Negative Bias Temperature Instability (
nbti-1-dut
) project performs NBTI testing on a p-
MOSFET with temperature and DC stress. The following figure shows the project tree when the
nbti-1-dut
project is selected.
Figure 831: Project tree for nbti-1-dut
