Section 6: Clarius
Model 4200A-SCS Parameter Analyzer Reference Manual
6-314
4200A-901-01 Rev. C / February 2017
Matrixulib user library
The
Matrixulib
connects instrument terminals to output pins using a Keithley Instruments Series
700 Switching System. It is for use with switching systems that are configured as a general purpose,
low current, or ultra-low current matrix.
Matrixulib user module
User module
Description
ConnectPins
Allows you to control your switch matrix.
nvm user library
The
nvm
user library contains user modules that are used for nonvolatile memory tests that use a
source-measure and a pulse measure unit. The next table lists and briefly describes the user
modules.
For additional detail on working with user modules in the nvm user library, refer to the application note
"Pulse I-V Characterization of Non-Volatile Memory Technologies."
For detail on creating a custom user module for nonvolatile memory tests, refer to the read me file in
the directory
C:\s4200\kiuser\usrlib\nvm
.
nvm user modules
User module
Description
dcSweep
Applies a long signal, either positive or negative. You can specify the rise time,
the slew rate, and the time to hold the voltage at the top or bottom.
doubleSweep
Creates a waveform that consists of two voltage sweeps: 0 to V1, V1 to 0, 0 to
V2 and V2 to 0. The sweeps are generated on PMU1CH1. Channel
PMU1CH2 is kept at 0 V and measures current and charge.
doubleSweepSeg
Creates a waveform that consists of two voltage sweeps: 0 to V1, V1 to 0, 0 to
V2 and V2 to 0. The sweep is generated on PMU1CH1. Channel PMU1CH2 is
kept at 0 V and measures current and charge.
flashEndurance
Defines pulse sequences for the program/erase, program, and erase pulses. It
runs the program/erase sequence a defined number of times by logarithmically
spaced numbers of loops. After each iteration, it does program and erase one
more time with Vt extraction after each operation.
flashProgramErase
Defines waveform for Programming and Erasing pulse for both drain and gate.
getRes2
This function returns the resistance of a two-terminal resistor. Voltage
v_force
is forced on the top side of the device; 0 V is forced to the low side.
Measure current and reports resistance (V/I).
pramEndurance
Runs an endurance test for a PRAM. It runs iterations with a logarithmically
spaced number of SET/PULSE loops. Reports DUT resistance after
SET/RESET pulse. Also returns the amplitude of the SET current.
pramSweep
This function characterizes PRAM devices and produces RI/RV data. A
sequence of SET and RESET pulses, followed by the MEASURE pulses, sets
and resets the PRAM DUT.
pulse_test
Performs pulse testing according to the definition in the nonvolatile memory
structure. This function handles all PMU communications and does all
nonvolatile memory pulse testing.
