Model 4200A-SCS Pulse Card (PGU and PMU) User's Manual
Section 4: Pulse card concepts
4200A-PMU-900-01 Rev. A December 2020
4-7
4200A-SCS power requirements for valid combinations of internal system instruments
Idle power
Power used in test
nPMU
nRPM
nC10
nC40
nHPSMU
PowerIDLE
PowerTEST
PowerTOTAL
5
10
0
2
1
294
154.2
448.2
5
10
0
2
2
294
199.2
493.2
6
12
12
0
0
352.8
218.4
336
6
12
12
0
1
352.8
263.4
381
6
12
0
2
0
352.8
308.4
426
6
12
0
1
1
352.8
123.6
241.2
The power limit check is performed in both ITMs and UTMs. In ITMs, exceeding the power limit will
display a message similar to the one shown in the following figure when configuring PMU.
Figure 81: ITM maximum power exceeded message
For UTMs, the message appears in the Clarius Messages pane.
Pulse source-measure concepts
Ultra-fast I-V sourcing and measurement have become increasingly important capabilities for many
technologies, including compound semiconductors, medium-power devices, nonvolatile memory,
microelectromechanical systems (MEMs), nanodevices, solar cells, and CMOS devices. Using pulsed
I-V signals to characterize devices rather than DC signals makes it possible to study or reduce the
effects of self-heating (joule heating) or to minimize current drift or degradation in measurements due
to trapped charge. Transient I-V measurements allow scientists and engineers to capture ultra
high-speed current or voltage waveforms in the time domain or to study dynamic test circuits. Pulsed
sourcing can be used to stress test a device using an AC signal during reliability cycling or in a
multi-level waveform mode to program or erase memory devices. The 4225-PMU Ultra-Fast I-V
Module for the 4200A-SCS supports many of these high-speed sourcing and measurement
applications.
