Model 6220/6221 Reference Manual
Triggering
8-5
Return to
Event detectors and control sources
A control source holds up operation until the programmed event occurs and is
detected. Note that there are four detector bypasses (two of which are one-time
bypasses). A bypass around a detector is only enabled if the appropriate TLink
control source is selected. See TLink control source (Arm-In and Trigger-In) as fol-
lows for details.
Arm-In source
— The Arm-In control sources, which control entire sweeps, are
explained as follows:
•
IMMEDIATE
(ARM:SOURce IMMediate) — Event detection for the arm
layer is satisfied immediately allowing operation to continue into the trigger
layer.
•
GPIB
(ARM:SOURce BUS) — Event detection for the arm layer is satisfied
when a bus trigger (GET or *TRG) is received by the Model 622x. Note that
GET is a general bus command (see
) and not a three-letter
command word.
•
TIMER
(ARM:SOURce TIMer) — Event detection for the arm layer is imme-
diately satisfied after the instrument leaves the idle state. Detection for each
subsequent pass is satisfied when the programmed timer interval elapses.
The timer resets to its initial state when the instrument goes back into idle.
•
MANUAL
(ARM:SOURce MANual) — Event detection for the arm layer is
satisfied by pressing the TRIG key. The Model 622x must be in the local
mode for it to respond to the TRIG key. Press LOCAL to place the Model
622x in local.
•
TLINK
(ARM:SOURce TLINk) — Event detection for the arm layer is satis-
fied when an input trigger via the TRIGGER LINK connector is received by
the Model 622x. Note that if the source bypass is set to ONCE
(ARM:DIRection SOURce), operation will initially loop around the source
detector after the instrument leaves the idle state. Detection for each sub-
sequent pass is satisfied by an input trigger. The bypass resets when the
instrument goes into idle.
•
⇓
STEST
(ARM:SOURce NSTest) — Event detection for the arm layer is
satisfied when a negative-going pulse (via the SOT line of the Digital I/O) is
received. (See
“Digital I/O port,” on page 9-5
•
⇑
STEST
(ARM:SOURce PSTest) — Event detection for the arm layer is
satisfied when a positive-going pulse (via the SOT line of the Digital I/O) is
received. (See
“Digital I/O port,” on page 9-5.
)
•
⇓⇑
STEST
(ARM:SOURce BSTest) — Event detection for the arm layer is
satisfied when either a positive-going or a negative-going pulse (via the
SOT line of the Digital I/O) is received. (See
“Digital I/O port,” on page 9-5
.)
•
ARM:SIGNal (remote only) — Used as a one-time bypass for the ARM
layer control source and move on to the next layer in the trigger model (the
TRIGger layer event detection in this case).
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Summary of Contents for 6220
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