9-8
Sweep Operation
Sweep branching
When using a Source Memory Sweep while performing limit tests, the normal sequence of
sweep memory points can be changed. This is useful when, based on the results of an initial
test, a different set of tests are needed.
The sweep can branch to a specified memory location point, or proceed to the next memory
location in the list. When a memory location is specified, the sweep will branch to that memory
location if the test is successful (PASS condition). If not successful (FAIL condition), the
sweep proceeds to the next memory location in the list. With NEXT selected (the default), the
sweep proceeds to the next memory location in the list regardless of the outcome of the test
(PASS or FAIL condition).
Figure 9-5 shows a six-point sweep branching example. In this case, the unit is programmed
to branch to location 7 when a pass condition occurs at location 3.
Caution must be used when branching since infinite memory loops can inadvertently be cre-
ated. A single Source Memory Sweep will always sweep the number of points specified,
regardless of how many branches were taken.
Memory sweep branching option is set from the PASS (SRC MEM LOC) item of the CON-
FIG LIMITS MENU. (See Section 11,
Limit testing
and
Configure limit tests
for details.) Via
remote, use the :CALCulate2:CLIMits:PASS:SMLocation command. (See Section 17,
Config-
uring and running a sweep
.) See
Diode test example
below for a typical example.
NOTE
Branch on fail is available via remote only with CALC2:CLIM:FAIL:SML. See
Section 17 for details.
Testing polarized devices
— Branching can simplify the testing of polarized devices such
as diodes. Because a diode is polarity sensitive, you normally have to be careful when installing
it in the component handler. Installing the diode one way forward biases it, and installing it the
other way reverse biases it. Memory sweep branching can eliminate this installation problem.
Source Memory Locations
1
2
3
4
5
6
7
8
9
Should be the same to
maintain triggering sequence.
Pass
Figure 9-5
Six-point test
branching example
Summary of Contents for 6430
Page 26: ......
Page 32: ......
Page 78: ...2 14 Connections ...
Page 98: ...3 20 Basic Source Measure Operation ...
Page 138: ...5 30 Source Measure Concepts ...
Page 156: ...6 18 Range Digits Speed and Filters ...
Page 168: ...7 12 Relative and Math ...
Page 176: ...8 8 Data Store ...
Page 202: ...9 26 Sweep Operation ...
Page 248: ...11 22 Limit Testing ...
Page 310: ...16 6 SCPI Signal Oriented Measurement Commands ...
Page 418: ...17 108 SCPI Command Reference ...
Page 450: ...18 32 Performance Verification ...
Page 477: ...A Specifications ...
Page 489: ...B StatusandErrorMessages ...
Page 498: ...B 10 Status and Error Messages ...
Page 499: ...C DataFlow ...
Page 503: ...D IEEE 488BusOverview ...
Page 518: ...D 16 IEEE 488 Bus Overview ...
Page 519: ...E IEEE 488andSCPI ConformanceInformation ...
Page 523: ...F MeasurementConsiderations ...
Page 539: ...G GPIB488 1Protocol ...
Page 557: ......