DMM6500 6½ Digit Multimeter User's Manual
Section 8: Grading and binning resistors
DMM6500-900-01Rev. A / April 2018
8-3
Resistor grading and binning test
This resistance-grading application uses limit tests to inspect a single resistor under test against
multiple limits until the first failure occurs. When the resistor fails, it is placed into a designated
resistance tolerance bin, as defined by the limits.
Resistors are placed into bins based on the bit patterns that are assigned to the limits. In this
example, the DMM6500 GradeBinning trigger model template is used to simplify the application. This
trigger model template grades components into four tolerance levels (for example, 20-%, 10-%, 5-%,
and 1-%) as defined by limits 1 to 4. A single spot measurement is inspected against multiple limits,
which tighten progressively around the same nominal value. Since there is no need to continue
checking limits once the appropriate tolerance level for a resistor under test is determined, this
application typically bins the tested resistors immediately.
Because the limits are inspected in ascending numeric order, the measured resistance is checked
first against Limit 1, which is the 20 % limit. If the resistor fails this limit inspection, its resistance value
is outside of the 20 % tolerance band, and the trigger model outputs the Limit 1 Fail Pattern, which
causes the component handler to place the resistor in the Limit 1 fail bin (20 % fail bin).
If a resistor passes the 20 % limit test, the resistance value is checked against Limit 2, which is the 10
% limit value. If the resistor fails this limit inspection, the resistance is outside of the 10% tolerance
band. The trigger model outputs the Limit 2 Fail Pattern, which causes the component handler to
place the resistor in the Limit 2 fail bin (10% fail bin).
If a resistor passes the 10 % limit test, the resistance value is checked against Limit 3, which is the 5
% limit value. If a resistor passes all the limit tests, the trigger model outputs the Overall Pass Bit
Pattern, which causes the component handler to place the resistor in the bin for components that
have passed all the limit checks.
For this example, the same fail pattern is assigned to both the lower and upper bounds of the limits.
Therefore, a fail bin contains resistance values in the range R-P % to R+P %. P in this example is 20,
10, 5, or 1. You can assign different bit patterns for different limit values.
For this application, you will:
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Reset the instrument.
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Select the 4-wire resistance function.
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Enable offset compensation.
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Set autozero to Once.
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Set up digital I/O lines one to four as outputs to component handler.
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Set up digital I/O line five for trigger-model control, detecting the trigger as the start-of-test input.
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Set up digital I/O line six as the end-of-test output notification.
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Initiate the GradeBinning trigger-model template.
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Display "Test Completed" on the front panel.
