S530 Parametric Test System Test Subroutine Library User's Manual
Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015
3-51
Make sure the collector current range selected is not near the bend in the I
B
-V
CE
curve (knee region of
the curve). If operated within this region, the
rcsat
subroutine may return negative or unpredictable
results.
Two delays are incorporated into the
rcsat
subroutine; these delays calculate the time required for a
stable forcing of base-emitter current (I
BE
) with a 3 V emitter voltage limit and I
CE
with a 16 V voltage
limit.
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
SUB
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
Typical value for the
beta
parameter is 10.
V/I polarities
NPN +I
CE
and -V
SUB
PNP -I
CE
and -V
SUB
Source-measure units (SMUs)
SMU1: Sweeps I
CE
, 16 V voltage limit, measures V
CESAT
SMU2: Sweeps I
CE
/
, 3 V voltage limit
SMU3: Forces
vsub
, default current limit
